Combined Roughness and Contour Measurements XCR 20

New generation of combined roughness and contour measurement systems.

Features

  • Used for waviness measurements over long travelling lengths of up to 120 mm (4.72 in)
  • Saves space because both drive units (MarSurf PCV 200 contour drive unit and GD 25 roughness drive unit) can be adapted using the corresponding combi-mount on the ST 500 or ST 750 measuring stand
  • Roughness and contour evaluations possible from a single measurement
  • High precision contour and roughness evaluation with the MarSurf UD 120 measuring system on components requiring a large stroke and very high resolution
  • Option of rapidly switching between roughness and contour measurements

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